R&D Scientist – Surface & Interface Characterization

About the role

Join Qnity’s innovative materials team to drive advanced electronics forward. You will lead cutting‑edge surface and interface characterization projects, applying a range of scanning probe microscopy techniques to solve complex material challenges.

Key responsibilities

• Lead and execute advanced surface and interface characterization projects using Atomic Force Microscopy (AFM) and related Scanning Probe Microscopy (SPM) techniques.
• Develop quantitative methodologies for nanoscale topography, mechanical, electrical, and surface property analysis.
• Perform and interpret advanced AFM measurements such as KPFM, EFM, QNM, LFM, and Conductive AFM.
• Collaborate with Reliability, Process Development, Materials R&D, and Failure Analysis teams to identify root causes and resolve technical issues.
• Create new characterization workflows and data‑analysis methods to enhance understanding of material interfaces and process‑performance relationships.
• Support technology development programs for advanced packaging, interconnect materials, and conductive adhesives.
• Communicate findings through reports, presentations, and technical reviews for internal and external stakeholders.

Required profile

• Ph.D. or M.S. in Materials Science, Physics, Chemistry, Nanotechnology, Electrical Engineering, or a related discipline.
• Hands‑on experience operating AFM/SPM systems and strong understanding of nanoscale surface characterization principles.
• Demonstrated expertise with one or more techniques: KPFM, EFM, QNM, LFM, Conductive AFM.
• Excellent analytical, problem‑solving, and independent experimental design skills.
• Strong written and verbal communication skills in English.

Required skills

• Atomic Force Microscopy (AFM)
• Scanning Probe Microscopy (SPM)
• Kelvin Probe Force Microscopy (KPFM)
• Electrostatic Force Microscopy (EFM)
• Quantitative Nanomechanical Mapping (QNM)
• Lateral Force Microscopy (LFM)
• Conductive AFM
• SIMS, XPS, AES (preferred)