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MBIST Diagnostics Engineer - Sr Staff/Staff Engineer

Qualcomm · Hsinchu

New
🇬🇧 English
Python Perl TCL data visualization tools AI/ML techniques Mentor Tessent Synopsys HTOL RMA debug

Job description

About the role

We are seeking an experienced MBIST Diagnostics Engineer to lead development of advanced memory diagnostic methodologies and tools for next‑generation SoCs. The role focuses on DRAM testing, failure analysis, and AI/ML‑based pattern recognition to improve memory yield and reliability in high‑volume manufacturing.

Key responsibilities

  • Develop and enhance memory diagnostic methodologies, including DRAM‑specific diagnostics and test/repair algorithms (BIRA, ECC, redundancy analysis).
  • Isolate failing memory locations, analyze failure signatures, and support yield improvement, RMA, and HTOL debug.
  • Design and implement AI/ML‑based pattern recognition tools for advanced bit‑mapping and failure characterization.
  • Collaborate with silicon validation, product engineering, and yield analysis teams to correlate diagnostics with silicon behavior.
  • Provide technical leadership and mentorship to junior engineers and cross‑functional partners.

Required profile

  • Bachelor’s, Master’s or PhD in Computer Science, Electrical/Electronics Engineering or related field.
  • 4+ years (or equivalent with higher degree) of hardware engineering experience, preferably in memory diagnostics, DRAM test, and failure analysis.
  • Strong analytical and problem‑solving skills with a data‑driven mindset.
  • Excellent communication and collaboration abilities in a global, cross‑functional environment.

Required skills

  • Experience developing diagnostic tools for emerging memory technologies.
  • Proficiency in Python, Perl, TCL and data visualization tools.
  • Knowledge of fault isolation, redundancy schemes, fault models, memory test algorithms, and MBIST implementation using tools such as Mentor Tessent or Synopsys.
  • Familiarity with AI/ML techniques applied to pattern recognition or data analytics in semiconductor test or yield domains.
  • Experience with HTOL, RMA debug, and high‑volume manufacturing diagnostics.

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Published 3小时前

Expires 1个月后

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